{"title":"Flexible cache error protection using an ECC FIFO","authors":"D. Yoon, M. Erez","doi":"10.1145/1654059.1654109","DOIUrl":null,"url":null,"abstract":"We present ECC FIFO, a mechanism enabling two-tiered last-level cache error protection using an arbitrarily strong tier-2 code without increasing on-chip storage. Instead of adding redundant ECC information to each cache line, our ECC FIFO mechanism off-loads the extra information to off-chip DRAM. We augment each cache line with a tier-1 code, which provides error detection consuming limited resources. The redundancy required for strong protection is provided by a tier-2 code placed in off-chip memory. Because errors that require tier-2 correction are rare, the overhead of accessing DRAM is unimportant. We show how this method can save 15-25% and 10-17% of on-chip cache area and power respectively while minimally impacting performance, which decreases by 1% on average across a range of scientific and consumer benchmarks.","PeriodicalId":371415,"journal":{"name":"Proceedings of the Conference on High Performance Computing Networking, Storage and Analysis","volume":"68 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"28","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Conference on High Performance Computing Networking, Storage and Analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1654059.1654109","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 28
Abstract
We present ECC FIFO, a mechanism enabling two-tiered last-level cache error protection using an arbitrarily strong tier-2 code without increasing on-chip storage. Instead of adding redundant ECC information to each cache line, our ECC FIFO mechanism off-loads the extra information to off-chip DRAM. We augment each cache line with a tier-1 code, which provides error detection consuming limited resources. The redundancy required for strong protection is provided by a tier-2 code placed in off-chip memory. Because errors that require tier-2 correction are rare, the overhead of accessing DRAM is unimportant. We show how this method can save 15-25% and 10-17% of on-chip cache area and power respectively while minimally impacting performance, which decreases by 1% on average across a range of scientific and consumer benchmarks.