Accelerated Degradation Testing and MOGP Method

Abstract

In order to predict the reliability of semiconductor lasers, an accelerated degradation test (ADT) was proposed as an element of reliability testing. Temperature-stressed ADT was applied for 8 Semiconductor lasers which used in space missions, and the degradation characteristics of output power of semiconductor lasers were studied. Then, a reliability model based multi-output Gaussian process regression (MOGP) was proposed to evaluate the lifetime and reliability for laser diodes. The advantage of the proposed MOGP based method is that it utilizes the output correlation between multiple degradation traces to make the outputs utilize each other's information and provide more accurate prediction than single modeling. Thereby improving the prediction accuracy. Furthermore, verifying applications and cases studies are discussed to prove the generality and practicability of the proposed reliability prediction model. Results show that the accuracy of the proposed MOGP based method is twice that of the SVM method.