Comparison of the Electrical Ageing Under Sinusoidal and Square-Wave Stresses

R. Acheen, C. Abadie, T. Lebey, T. Billard, Sténhane Duchesne
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引用次数: 5

Abstract

The problematics of ageing in the Electrical Insulation Systems (EIS), especially in machines fed by adjustable speed drives, have been studied in numerous scientific publications, and even more with the introduction of wide-band gaps materials such as SiC. These fast-switching components induce over-voltages, which allow partial discharges to incept and lead to an erosion of the insulation materials. Various ageing mechanisms exist and depend on multiple parameters, but the influence of voltage slope, and therefore rise time, is a controversial subject which could require some further examination. Thus, it may be interesting to determine if these parameters have a direct impact on the ageing of EIS or if they only contribute to it indirectly, while their own effect would be less significant. To clarify this point, accelerated tests were performed and aimed at the comparison between the ageing of samples supplied by sinusoidal and square-wave stresses. The amplitude and frequency of the signals were the same, with a duty cycle of 50% in order to study the influence of the voltage slope only. Several levels of stress and frequencies were selected for the analysis and with additional purpose of reduction of tests duration. Lifetimes of samples were recorded to determine if there were any differences and to what extent.
正弦波和方波应力下电老化的比较
电气绝缘系统(EIS)中的老化问题,特别是在由可调速驱动器驱动的机器中,已经在许多科学出版物中进行了研究,随着诸如SiC之类的宽带隙材料的引入,甚至更多。这些快速开关元件诱导过电压,这允许部分放电开始并导致绝缘材料的侵蚀。存在各种老化机制,并依赖于多个参数,但电压斜率的影响,因此上升时间,是一个有争议的主题,可能需要进一步的研究。因此,确定这些参数是否对环境影响信息系统的老化有直接影响,或者它们是否只是间接地起作用,而它们自己的影响则不那么显著,这可能是有趣的。为了澄清这一点,进行了加速试验,目的是比较正弦波和方波应力提供的样品的老化。信号的幅值和频率相同,占空比为50%,仅研究电压斜率的影响。选择了几个应力水平和频率进行分析,并附带减少测试持续时间的目的。记录样品的寿命以确定是否存在差异以及差异的程度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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