Challenges of Replacing Legacy Analog Instrumentation During TPS Rehost Projects

Y. Eracar, Thomas Jacobs
{"title":"Challenges of Replacing Legacy Analog Instrumentation During TPS Rehost Projects","authors":"Y. Eracar, Thomas Jacobs","doi":"10.1109/AUTEST.2018.8532542","DOIUrl":null,"url":null,"abstract":"This paper starts with a brief overview of Test Program Set (TPS) life cycle and explains TPS maintenance (and/or re-host) issues that come with long-term support requirements. The focus of the paper is the compatibility issues found between the legacy and the replacement analog instrumentation during two recent TPS re-host projects. A detailed analysis is provided for the compatibility issues and the applied solutions from the perspective of both the TPS developer and the analog instrument vendor. The paper is concluded with a section on possible approaches to design a new analog instrument that needs to replace a legacy instrument without sacrificing from the features necessary for modern test requirements.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"124 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2018.8532542","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

This paper starts with a brief overview of Test Program Set (TPS) life cycle and explains TPS maintenance (and/or re-host) issues that come with long-term support requirements. The focus of the paper is the compatibility issues found between the legacy and the replacement analog instrumentation during two recent TPS re-host projects. A detailed analysis is provided for the compatibility issues and the applied solutions from the perspective of both the TPS developer and the analog instrument vendor. The paper is concluded with a section on possible approaches to design a new analog instrument that needs to replace a legacy instrument without sacrificing from the features necessary for modern test requirements.
在TPS重新主机项目中替换遗留模拟仪器的挑战
本文首先简要概述了测试程序集(TPS)的生命周期,并解释了长期支持需求带来的TPS维护(和/或重新托管)问题。本文的重点是在最近的两个TPS重新托管项目中发现的遗留和替换模拟仪器之间的兼容性问题。从TPS开发人员和模拟仪器供应商的角度对兼容性问题和应用解决方案进行了详细分析。本文的最后一节讨论了设计一种新的模拟仪器的可能方法,这种仪器需要在不牺牲现代测试要求所需的功能的情况下取代传统仪器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信