{"title":"Synthetic Instrumentation: The road ahead","authors":"M. Granieri, R. W. Lowdermilk","doi":"10.1109/AUTEST.2009.5314094","DOIUrl":null,"url":null,"abstract":"This paper provides the reader with an overview of current Synthetic Instrumentation technology and a discussion of the probable future direction of this interesting and disruptive technology. The paper opens with a brief introduction and technical overview of Synthetic Instrumentation and then presents a discourse on the primary attributes of Synthetic Instrumentation. Having reviewed the basics of Synthetic Instrumentation technology, the paper then goes on to discuss the fundamental classes/types of Synthetic Instruments (SI), their associated attributes, and typical types of users associated with these SI classes. The authors then discuss how Synthetic Instrumentation fits in the current Test and Measurement (T&M) application continuum. The paper concludes with a discussion on the possible disruptive impact of this emerging technology on the Test and Measurement (T&M) marketplace and the key technologies that will have a future impact on the continuing evolution of Synthetic Instrumentation.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"193 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2009.5314094","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
This paper provides the reader with an overview of current Synthetic Instrumentation technology and a discussion of the probable future direction of this interesting and disruptive technology. The paper opens with a brief introduction and technical overview of Synthetic Instrumentation and then presents a discourse on the primary attributes of Synthetic Instrumentation. Having reviewed the basics of Synthetic Instrumentation technology, the paper then goes on to discuss the fundamental classes/types of Synthetic Instruments (SI), their associated attributes, and typical types of users associated with these SI classes. The authors then discuss how Synthetic Instrumentation fits in the current Test and Measurement (T&M) application continuum. The paper concludes with a discussion on the possible disruptive impact of this emerging technology on the Test and Measurement (T&M) marketplace and the key technologies that will have a future impact on the continuing evolution of Synthetic Instrumentation.