{"title":"Magnetic Properties of CoGdTb Thin Films for Thermo-Magnetic/Magneto-Optic Recording","authors":"D. Hairston, M. Kryder","doi":"10.1364/ods.1985.tubb4","DOIUrl":null,"url":null,"abstract":"Amorphous CoGd films proposed for magneto-optic recording1 lack sufficient coercivity, HC, to support sub-micron domains. Amorphous CoGdTb films having low Tb substitution and prepared by r.f. sputtering have magnetic properties similar to CoGd films2. However CoGdTb films have increased HC enabling them to support submicron domains3, 4. CoGdTb films were prepared under a variety of sputtering conditions and characterized for their thermomagnetic/magneto-optic recording application. The influence of substrate bias voltage, VBias, and argon partial pressure, PAr, used during fabrication were determined.","PeriodicalId":268493,"journal":{"name":"Topical Meeting on Optical Data Storage","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Topical Meeting on Optical Data Storage","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/ods.1985.tubb4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Amorphous CoGd films proposed for magneto-optic recording1 lack sufficient coercivity, HC, to support sub-micron domains. Amorphous CoGdTb films having low Tb substitution and prepared by r.f. sputtering have magnetic properties similar to CoGd films2. However CoGdTb films have increased HC enabling them to support submicron domains3, 4. CoGdTb films were prepared under a variety of sputtering conditions and characterized for their thermomagnetic/magneto-optic recording application. The influence of substrate bias voltage, VBias, and argon partial pressure, PAr, used during fabrication were determined.