{"title":"Design and Characterization of Angular Bend Substrate Integrated Waveguide (SIW) Bandpass Filter for Microwave Ku-Band Applications","authors":"S. Moitra, P. Bhowmik, A. Muvvala","doi":"10.1109/IC3IOT.2018.8668172","DOIUrl":null,"url":null,"abstract":"Substrate Integrated Waveguide (SIW) transmission line section is modified by using I shaped electromagnetic bandgap structure (EBG) slots to obtain bandpass filter characteristic in this paper. Waveguide bend of 150degrees is provided in view of increased flexibility in designing multi-element compact microwave integrated circuits (MICs). Several parameters of the waveguide bend as well as the I slots are analyzed and presented with detailed outcome. The experiments are carried out over a Neltec NH9320 material of thickness 0.8mm and dielectric constant of 3.2.","PeriodicalId":155587,"journal":{"name":"2018 International Conference on Communication, Computing and Internet of Things (IC3IoT)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Conference on Communication, Computing and Internet of Things (IC3IoT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IC3IOT.2018.8668172","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Substrate Integrated Waveguide (SIW) transmission line section is modified by using I shaped electromagnetic bandgap structure (EBG) slots to obtain bandpass filter characteristic in this paper. Waveguide bend of 150degrees is provided in view of increased flexibility in designing multi-element compact microwave integrated circuits (MICs). Several parameters of the waveguide bend as well as the I slots are analyzed and presented with detailed outcome. The experiments are carried out over a Neltec NH9320 material of thickness 0.8mm and dielectric constant of 3.2.