Combinational part structure simplification of fully delay testable sequential circuit

Abstract

The method of a sequential circuit design based on using mixed description of a circuit behavior has been developed by us earlier. The method provides fully delay testability of a combinational part of a sequential circuit. It is oriented to cut down the path lengths of the obtained circuits. In this paper the possibilities of a simplification of combinational parts of the sequential circuits are considered. They are based on using corrected Free BDDs instead of ROBDDs and factorizing monotonous products. Some experimental results are given.