Effect of Storage Conditions on Ti-6Al-4V Surface Wettability

The Journal of Undergraduate Research at the University of Illinois at Chicago Pub Date : 2014-04-01 DOI:10.5210/JUR.V7I1.7527

C. Peixoto, A. Butt, C. Takoudis

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Abstract

The relationship between storage conditions and wettability of annealed micro-rough samples was investigated in this study. Micro-roughness (2.45 ± 0.43 μm) was obtained through sandblasting and acid-etching in sulfuric acid and hydrogen peroxide. Non-annealed samples (control) and samples annealed at 400 °C and 600 °C were used. In order to investigate the influence of storage conditions on the surface wettability, Ti-6Al-4V disks were 1) wrapped in Kimwipe inside a plastic bag, 2) stored in petri-dishes containing 20 mL deionized water (DI-water) at room temperature, and 3) stored in petri-dishes containing 20 mL cold DI-water (8 ± 2 °C). Surface characterization was conducted using water contact angle (WCA) measurements, white light interferometry (WLI), and fourier transform infrared (FTIR) spectroscopy. Disks immersed in DI-water maintained higher wettability when compared to Kimwipe groups over the course of 34 days regardless of the storage temperature. In addition, samples annealed at 600 °C showed superior wettability due to the rutile nature of the oxide film.

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贮存条件对Ti-6Al-4V表面润湿性的影响

研究了微粗糙退火样品的润湿性与贮藏条件的关系。在硫酸和双氧水中进行喷砂和酸蚀，获得了2.45±0.43 μm的微粗糙度。使用未退火样品(对照)和400°C和600°C退火样品。为了研究储存条件对表面润湿性的影响，将Ti-6Al-4V磁盘1)用Kimwipe包在塑料袋内，2)室温下储存于含20 mL去离子水(DI-water)的培养皿中，3)储存于含20 mL冷水(8±2℃)的培养皿中。利用水接触角(WCA)测量、白光干涉测量(WLI)和傅里叶变换红外(FTIR)光谱对表面进行了表征。与Kimwipe组相比，浸泡在di水中的磁盘在34天的过程中保持了更高的润湿性，而不管储存温度如何。此外，由于氧化膜的金红石性质，在600°C退火的样品显示出优越的润湿性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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The Journal of Undergraduate Research at the University of Illinois at Chicago

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