Radiated-Emission Ramifications of Multiple IC Sourcing

Abstract

An unaccep tab le increase in the rad ia ted emissions am plitudes of an e lectron ic d a ta processing product was a ttr ib u ted to m ultiple in teg ra ted -c ircu it (IC) sourcing. Conducted w aveform s genera ted by these devices on the data /add ress bus w ere m easured in the tim e domain. Emissions rad ia ted from various IC sources w ere m easured in the frequency domain a t an open-field te s t site . Interchanging ICs, even though of a sam e device type, had a significant im pact upon th e EMC profile.