The Science of Electronics in Extreme Electromagnetic Environments II - Circuit Effects

Abstract

This abstract covers Part-II of a two-part presentation series on the scientific advancements made in the AFOSR/AFRL Center of Excellence (CoE) for Electronics in Extreme Electromagnetic Environments, spanning the time-period 2015-present. In specific, this presentation focuses on the development and experimental validation of statistical and deterministic physics-based predictive models describing the functional state of electronic devices (semiconductor, electro-optic and quantum), and the amalgamation of these devices to circuits and subcomponents, when subjected to extreme electromagnetic interference (EEMI). This presentation follows a companion presentation [1] which discusses the development and experimental validation of statistical and deterministic physics-based models describing coupling paradigms for EEMI in complicated enclosures which houses these sensitive electronic devices, circuits and subcomponents. Taken together, the two presentations advance the state-of-the-art in fundamental physics-based modeling of current and future electronic technologies in extreme electromagnetic environments.