Multi-Phase Fault Detection and Analysis in FPGA Interconnects

Shilpa Dandoti, V. D. Mytri
{"title":"Multi-Phase Fault Detection and Analysis in FPGA Interconnects","authors":"Shilpa Dandoti, V. D. Mytri","doi":"10.1109/PACC.2011.5978860","DOIUrl":null,"url":null,"abstract":"With the increase in integration density in FPGA devices, the possibility of interconnect faults are increasing. Various fault diagnosis approach were observed for the detection of faults in FPGA, through the conventional ATE. These devices are designed for the detection of logical faults occurring in the operation of the FPGA. The ATE devices are currently designed to diagnosis the FPGA operation for faults and intern the fault detection is rectified by reprogramming the device. The localization of such faults will result in faster fault diagnosis. In this paper an approach for faults in FPGA interconnects is developed called forward tree coding. The approach is developed to isolate the fault region in a defined FPGA to reduce the time to market of digital devices. The designing and realization of the suggested approach on a targeted Xilinx device is also developed to evaluate its real time feasibility.","PeriodicalId":403612,"journal":{"name":"2011 International Conference on Process Automation, Control and Computing","volume":"504 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 International Conference on Process Automation, Control and Computing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PACC.2011.5978860","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

With the increase in integration density in FPGA devices, the possibility of interconnect faults are increasing. Various fault diagnosis approach were observed for the detection of faults in FPGA, through the conventional ATE. These devices are designed for the detection of logical faults occurring in the operation of the FPGA. The ATE devices are currently designed to diagnosis the FPGA operation for faults and intern the fault detection is rectified by reprogramming the device. The localization of such faults will result in faster fault diagnosis. In this paper an approach for faults in FPGA interconnects is developed called forward tree coding. The approach is developed to isolate the fault region in a defined FPGA to reduce the time to market of digital devices. The designing and realization of the suggested approach on a targeted Xilinx device is also developed to evaluate its real time feasibility.
FPGA互连中的多相故障检测与分析
随着FPGA器件集成密度的增加,出现互连故障的可能性也在增加。观察了各种故障诊断方法,通过传统的ATE检测FPGA中的故障。这些器件设计用于检测FPGA运行中发生的逻辑故障。ATE设备目前设计用于诊断FPGA操作的故障,并通过重新编程设备来纠正故障检测。对此类故障进行定位,可以更快地进行故障诊断。本文提出了一种针对FPGA互连故障的前向树编码方法。该方法用于隔离定义FPGA中的故障区域,以缩短数字器件的上市时间。本文还对该方法在Xilinx目标器件上的设计和实现进行了研究,以评估其实时可行性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信