Design of LQFP chip pin defect detection system based on machine vision

Abstract

In order to solve the problems in manual detection of LQFP chip defects, an automatic detection system of LQFP chip pin defects based on machine vision is designed. The system can use ARM-DSP dual-core architecture to rapidly realize image acquisition, processing, feature extraction and peripheral applications. And then a fast segmentation algorithm based on dynamic threshold is designed to obtain the chip feature image. The automatic detection of LQFP chip pin defects can be realized by using the methods such as grayscale transition detector to detect the pin midpoint, midpoint line fitting and pin spacing statistics. The experimental results show that the system is fast, accurate and feasible.