Automation Measurement System of Semiconductor Devices Parameters

Abstract

The main method for determining the semiconductor devices parameters is measuring and analytical processing of their current-voltage (CV) characteristics. Measuring complexes existing today for the implementation of this method are expensive and complex systems that are not economically profitable to use in the conditions of Ukraine production. In this work, an economical automated complex for CV characteristic measurement has been developed, based on a microcontroller control system with appropriate software, which, in connection with a computer, allows to provide express certification of solar cells and semiconductor devices by their current-voltage characteristics. The testing of the complex has been shown its ability to measure the CV characteristic with a sufficiently high accuracy with an average measurement error that does not exceed than 1%.