Experimental results of electron confinement in a silicon drift detector with saw tooth shaped p/sup +/ strips

J. Šonský, H. Valk, J. Huizenga, R. Hollander, C. V. van Eijk, P. Sarro
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Abstract

Recently it has been experimentally shown that saw tooth shaped p/sup +/ strips allows confinement of drifting electrons in the lateral direction. This is achieved by means of potential gutters induced by an appropriate saw tooth design of p/sup +/ cathodes. The saw tooth period p/sub x/ (=anode pitch) is the parameter mainly determining the maximal capacity of confined charge. Up-to-now the confinement effect was experimentally observed with a saw tooth detector with p/sub x/=500 /spl mu/m. The final detector is intended to have an anode pitch of 250 /spl mu/m. The simulation of a saw tooth configuration with p/sub x/=250 /spl mu/m, p/sub y/=200 /spl mu/m, and /spl alpha/=60/spl deg/ showed that potential gutters with a depth of 80 mV will be produced assuming a drift field of 250 V/cm. We will give experimental evidence of these shallow charge confining potential gutters.
锯齿形p/sup +/条硅漂移检测器中电子约束的实验结果
最近有实验表明,锯齿形的p/sup +/条允许在横向方向上限制漂移的电子。这是通过p/sup +/阴极的适当锯齿设计引起的电位沟槽来实现的。锯齿周期p/sub x/(=阳极节距)是决定限制电荷最大容量的主要参数。迄今为止,用p/sub x/=500 /spl mu/m的锯齿探测器对约束效应进行了实验观察。最后一个检测器的阳极螺距为250 /spl mu/m。对p/sub x/=250 /spl mu/m、p/sub y/=200 /spl mu/m、/spl alpha/=60/spl deg/的锯齿形结构进行仿真,结果表明,当漂移场为250 V/cm时,将产生深度为80 mV的电位沟槽。我们将给出这些浅电荷限制电位沟槽的实验证据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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