{"title":"Computer Aided Design and Development of a Intelligent Information Test System","authors":"Dongyang Wang, Chuping Yang, Yucheng Wei, Chao Ma","doi":"10.1109/ICESIT53460.2021.9696458","DOIUrl":null,"url":null,"abstract":"Facing the needs of comprehensive testing and maintenance support for large-scale naval equipment, in accordance with the design principles of generalization, modularization, serialization, intelligence, and integration, in response to problems such as difficult injection of faults, high risks, long cycles, and high costs in testable physical verification tests, Establish an equipment test index system, design and develop a test management system for test appraisal. On the basis of breakthroughs in key technologies such as virtual instrument hardware platform, test interface and software platform generalization, a generalized solution for large-scale complex equipment test identification integrated test [1] is realized.","PeriodicalId":164745,"journal":{"name":"2021 IEEE International Conference on Emergency Science and Information Technology (ICESIT)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Conference on Emergency Science and Information Technology (ICESIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICESIT53460.2021.9696458","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Facing the needs of comprehensive testing and maintenance support for large-scale naval equipment, in accordance with the design principles of generalization, modularization, serialization, intelligence, and integration, in response to problems such as difficult injection of faults, high risks, long cycles, and high costs in testable physical verification tests, Establish an equipment test index system, design and develop a test management system for test appraisal. On the basis of breakthroughs in key technologies such as virtual instrument hardware platform, test interface and software platform generalization, a generalized solution for large-scale complex equipment test identification integrated test [1] is realized.