A generic method for embedded measurement and compensation of process and temperature variations in SOCs

Abstract

This paper proposes an embedded method of measuring process and temperature variations using the resulting change in transconductance of affected transistors. It also presents a compensation scheme for these variations using a generic and versatile method that can conveniently be used in system-on-chip applications. The measuring and compensating system has been applied on a 9-stage current-controlled oscillator. Differences in oscillating frequency between corner cases have been reduced from over 90 MHz to less than 10 MHz.