Simulation of reflectometer system for complex reflection coefficient measurements

Abstract

This technical paper presents a simulation of three probes reflectometer system for complex reflection coefficient measurement. This involves designing a circuit of Reflectometer using Genesys software. The simulation results and data from published Three-Probe Reflectometer measurement system is being compared to show the accuracy of the simulation results. Using the design circuit, a microstrip circuit will be fabricated and complex reflection coefficients were measured using Vector Network Analyzer (VNA). A comparison was made between simulations, VNA and publishes data. From the comparison, it shows a close agreement between them. It shows that Microstrip Reflectometer can be used to measure Complex Reflection Coefficient.