A simple electrical model of acute and chronic injury (CTD) processes

Proceedings of 1994 20th Annual Northeast Bioengineering Conference Pub Date : 1994-03-17 DOI:10.1109/NEBC.1994.305173

J. LaCourse, T. McCoy

引用次数: 0

Abstract

A simple electrical analog model is used to understand the mechanisms of acute versus chronic disease processes, especially cumulative trauma disease. The model employs an RC circuit with inputs that allows typical exposure regimes.<>

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急慢性损伤(CTD)过程的简单电模型

一个简单的电模拟模型被用来理解急性与慢性疾病过程的机制，特别是累积性创伤疾病。该模型采用RC电路，其输入允许典型的暴露机制。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Proceedings of 1994 20th Annual Northeast Bioengineering Conference

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