Numerical techniques of the estimation the amount of waveguides surface roughness for the THz regime

N. V. Fedorkova, A.A. Sultanshin
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Abstract

The article is devoted to the problem of the efficient design of THz waveguides devices. Extreme small sizes of THz devices such as subharmonic pumped mixers for radiometer witch waveguides are integrated in copper block covered with 3 μm gold are presented. The three numerical techniques and direct measurements in the THz regime have been used to predict the effective conductivity reduction due to protrusions. Efficient design of THz systems requires the ability to predict effective conductivity, allowing engineers to determine the amount of surface roughness for acceptable reflection losses prior to fabrication. Full-wave numerical technique to predict the field enhancement factors for both the rf electric field and the rf magnetic field on the protrusion above smooth sample in the THz regime has been mentioned. The electric field and magnetic field enhancement factors on the hemispherical protrusion should be excluded in case the protrusions size are smaller than δ/50 and δ/1.5 correspondingly (δ is skin depth). Mie-Scattering-based approach approximates a unit cell of the grating as a circular cylinder protrusion the additional loss due to the protrusion compared with a perfectly flat surface of the same material. Hammerstad–Bekkadal Model demonstrates an analytical function which depends of sheet resistance for a sample with surface roughness on the surface roughness and skin depth of the metal. Numerical calculations using this technique predict 10% power absorption due to surface features 35 nm at 400 GHz. A layout of the apparatus for direct measurements of the effective conductivity of samples with roughness features using an open quasi-optical resonator is given. The results of theoretical calculation and empirical evaluation have been compared with computer simulation software taking into consideration of the effective conductivity only due to the change in the surface geometry. The comparison empirical results and numerical calculations full-wave numerical technique are more accurate for samples that are smooth relative to the skin depth. For surface features greater than the skin depth, we found the Hammerstad and Bekkadal model to be a better. The observed methods can be used as a rapid means to estimate waveguides surface roughness in terms of power loss in the THz regime.
太赫兹波段波导表面粗糙度估计的数值技术
本文主要研究太赫兹波导器件的高效设计问题。提出了一种极小尺寸的太赫兹器件,如用于辐射计开关波导的次谐波泵浦混频器,其集成在覆盖3 μm金的铜块中。利用三种数值技术和太赫兹区直接测量来预测由于突起引起的有效电导率降低。太赫兹系统的高效设计需要预测有效电导率的能力,使工程师能够在制造之前确定可接受的反射损耗的表面粗糙度。本文介绍了用全波数值方法预测太赫兹波段光滑样品上凸起处的射频电场和射频磁场增强系数的方法。当半球形突出物尺寸分别小于δ/50和δ/1.5 (δ为皮肤深度)时,应排除电场和磁场增强因子。基于mie散射的方法将光栅的单元格近似为一个圆柱凸出,与相同材料的完全平坦表面相比,由于凸出而造成的额外损失。Hammerstad-Bekkadal模型展示了一个分析函数,该函数依赖于具有表面粗糙度的样品的板电阻对金属表面粗糙度和蒙皮深度的影响。使用该技术的数值计算预测,由于在400 GHz下35 nm的表面特性,10%的功率吸收。给出了一种利用开放准光学谐振器直接测量具有粗糙度特征样品的有效电导率的装置布置。将理论计算和经验评价结果与仅考虑由于表面几何形状变化而导致的有效电导率的计算机模拟软件进行了比较。对比经验结果和数值计算,全波数值技术对于相对于皮肤深度光滑的样品更为准确。对于大于皮肤深度的表面特征,我们发现Hammerstad和Bekkadal模型是更好的。所观察到的方法可以作为一种快速的方法来估计波导表面粗糙度在太赫兹波段的功率损失。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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