MOS only voltage reference with improved line regulation for LDO voltage regulator applications

Guruprasad, K. Shama
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引用次数: 1

Abstract

In this paper a voltage reference circuit using only MOSFETs in 180 nm standard CMOS technology is presented. The proposed circuit does not utilize lateral or vertical BJTs since they are not well defined in a CMOS technology, they occupy large area and they cause bulk current leakage. Complementary and proportional to absolute temperature currents are generated using MOSFETs, operating in sub-threshold region. An additional negative feedback is introduced so that line regulation of reference circuit is significantly improved. In LDO voltage regulators, the line regulation of LDO is mainly dependent on line sensitivity of reference circuit. The proposed voltage reference circuit has been laid out in standard 180 nm CMOS technology. The post layout simulation results show that it produces a reference voltage of 600 mV for a minimum input supply of 1.2 V. and varies only 1.2 mV when supply voltage is varied from 1.2 V to 2 V. When temperature is swept from 0 0 C to 80 0 C, the change in the reference voltage is only 4.1 mV. Monte-Carlo statistical analysis of the circuit reveals that it is robust against local mismatch and global process variations.
MOS电压参考与改进的线路调节LDO稳压器应用
本文提出了一种仅使用mosfet的180 nm标准CMOS工艺的电压基准电路。所提出的电路不利用横向或垂直的bjt,因为它们在CMOS技术中没有很好地定义,它们占据了很大的面积,并且会导致大电流泄漏。使用在亚阈值区域工作的mosfet产生互补且与绝对温度成正比的电流。引入了额外的负反馈,使基准电路的线路调节得到了显著改善。在LDO稳压器中,LDO的线路调节主要取决于基准电路的线路灵敏度。所提出的电压基准电路已在标准的180nm CMOS技术上布局。后置仿真结果表明,在最小输入电压为1.2 V时,其基准电压为600 mV,在电源电压从1.2 V变化到2 V时,其基准电压仅变化1.2 mV。当温度从0°C扫至80°C时,参考电压的变化仅为4.1 mV。蒙特卡罗统计分析表明,该电路对局部失配和全局过程变化具有较强的鲁棒性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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