Analysis of narrow gap induced additional micro-ring loss

Kaung-Cheng Lin, Wei-Lun Chang, Ruei Hao You, Yung-Jui Chen
{"title":"Analysis of narrow gap induced additional micro-ring loss","authors":"Kaung-Cheng Lin, Wei-Lun Chang, Ruei Hao You, Yung-Jui Chen","doi":"10.1109/WOCC.2012.6198183","DOIUrl":null,"url":null,"abstract":"We have analyzed the coupling gap dependent micro-ring loss in a single ring all-pass filter configuration using the two dimension (2D) finite difference time domain (FDTD) and EIM (effective index method). We utilized a new analysis scheme by calculating the transmission signal as a function of input wavelength and fitting the transmission spectrum with a phenomenological ring loss parameter. This novel scheme circumvents the complex waveguide mode analysis process, when the coupling gap is small and the all-pass coupling region becomes multi-mode. We find that the radiation loss increases rapidly with decreasing coupling gap width when the gap reaches 200 nm or below. Our initial results show that the intrinsic bending loss of a silicon micro-ring (on oxide) with a radius of 2.5μm is about 3dB/cm. The total loss of the micro-ring with 150 nm coupling gap reaches 21.82dB/cm.","PeriodicalId":118220,"journal":{"name":"2012 21st Annual Wireless and Optical Communications Conference (WOCC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 21st Annual Wireless and Optical Communications Conference (WOCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WOCC.2012.6198183","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

We have analyzed the coupling gap dependent micro-ring loss in a single ring all-pass filter configuration using the two dimension (2D) finite difference time domain (FDTD) and EIM (effective index method). We utilized a new analysis scheme by calculating the transmission signal as a function of input wavelength and fitting the transmission spectrum with a phenomenological ring loss parameter. This novel scheme circumvents the complex waveguide mode analysis process, when the coupling gap is small and the all-pass coupling region becomes multi-mode. We find that the radiation loss increases rapidly with decreasing coupling gap width when the gap reaches 200 nm or below. Our initial results show that the intrinsic bending loss of a silicon micro-ring (on oxide) with a radius of 2.5μm is about 3dB/cm. The total loss of the micro-ring with 150 nm coupling gap reaches 21.82dB/cm.
窄间隙引起附加微环损耗的分析
利用二维时域有限差分法(FDTD)和有效指数法(EIM)分析了单环全通滤波器结构中耦合间隙相关的微环损耗。我们采用了一种新的分析方案,将传输信号作为输入波长的函数来计算,并使用象象学环损耗参数拟合传输光谱。该方案绕过了复杂的波导模式分析过程,使耦合间隙小,全通耦合区域变成多模。当耦合隙宽度达到200 nm及以下时,辐射损耗随耦合隙宽度的减小而迅速增加。我们的初步结果表明,半径为2.5μm的硅微环(在氧化物上)的本征弯曲损耗约为3dB/cm。耦合间隙为150 nm时,微环的总损耗达到21.82dB/cm。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信