See measurements on bulk samples of lucite and lexan

Abstract

The measurement of secondary electron emission (SEE) coefficients of many materials is covered in detail in the book by Bruining [1]. Some of the current interest in the SEE is generated by the importance of the electron multiplication process in the surface flashover of insulators in high voltage equipment [2]. Measurement of the SEE on the surface of dielectrics is difficult and only a few reports exist in the literature [3]. The major experimental problem is the charging which occurs on the dielectric surface when the SEE coefficient is not equal to one. This problem has been overcome by some experimenters by using such thin films of the dielectric that charge deposited on the surface would leak off rapidly through the material in spite of the high resistivity [4]. This approach is suitable for investigating the fundamental properties of materials but may not be relevant to the properties of, a commercially produced material from which an insulator is produced. Accordingly, we have devised a method by which bulk samples can be tested.