Design technology challenges for system and chip level designs in very deep submicron technologies

James Lin
{"title":"Design technology challenges for system and chip level designs in very deep submicron technologies","authors":"James Lin","doi":"10.1145/944645.944695","DOIUrl":null,"url":null,"abstract":"With very deep submicron process technologies, previously ignorable phenomena now have great impact on the robustness of IC designs. At the same time, the smaller feature sizes also enable an exponential increase in number of functions (or transistor count) available on chip. Complexity in process technology and design is widening the Design Technology gap, which, if not addressed properly, will threaten the continuation of process scaling and the industry's ability to benefit from it. The complexity of process and design technology, its impact on new designs, new products development and future solutions will be discussed in this presentation.","PeriodicalId":174422,"journal":{"name":"First IEEE/ACM/IFIP International Conference on Hardware/ Software Codesign and Systems Synthesis (IEEE Cat. No.03TH8721)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"First IEEE/ACM/IFIP International Conference on Hardware/ Software Codesign and Systems Synthesis (IEEE Cat. No.03TH8721)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/944645.944695","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

With very deep submicron process technologies, previously ignorable phenomena now have great impact on the robustness of IC designs. At the same time, the smaller feature sizes also enable an exponential increase in number of functions (or transistor count) available on chip. Complexity in process technology and design is widening the Design Technology gap, which, if not addressed properly, will threaten the continuation of process scaling and the industry's ability to benefit from it. The complexity of process and design technology, its impact on new designs, new products development and future solutions will be discussed in this presentation.
设计技术挑战系统和芯片级设计在非常深的亚微米技术
随着深亚微米制程技术的发展,以前可以忽略的现象现在对集成电路设计的稳健性有很大的影响。同时,更小的特征尺寸也使得芯片上可用的功能数量(或晶体管数量)呈指数增长。工艺技术和设计的复杂性正在扩大设计技术的差距,如果不能妥善解决,将威胁到工艺规模的延续和行业从中受益的能力。本演讲将讨论工艺和设计技术的复杂性及其对新设计、新产品开发和未来解决方案的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信