{"title":"Comparison of dynamic and static operation of a novel optical read-out technology for micromachined cantilever sensors","authors":"G. Putrino, A. Keating, M. Martyniuk, J. Dell","doi":"10.1109/COMMAD.2010.5699745","DOIUrl":null,"url":null,"abstract":"A novel, optical approach to the interrogation of MEMS cantilever sensors is discussed. We investigate the effects of placing a diffraction grating in a Si waveguide below a cantilever arm, to create a resonant cavity which will create interference on an optical signal through the waveguide. We look at FDTD simulations of the optical power transmitted through this device as the cantilever's height changes in relation to the diffraction grating. We discuss the use of this interrogation technique on micro-cantilever-based sensors operating in both the dynamic and static mode.","PeriodicalId":129653,"journal":{"name":"2010 Conference on Optoelectronic and Microelectronic Materials and Devices","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Conference on Optoelectronic and Microelectronic Materials and Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/COMMAD.2010.5699745","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A novel, optical approach to the interrogation of MEMS cantilever sensors is discussed. We investigate the effects of placing a diffraction grating in a Si waveguide below a cantilever arm, to create a resonant cavity which will create interference on an optical signal through the waveguide. We look at FDTD simulations of the optical power transmitted through this device as the cantilever's height changes in relation to the diffraction grating. We discuss the use of this interrogation technique on micro-cantilever-based sensors operating in both the dynamic and static mode.