Photocurrents and thermally stimulated currents in epoxy resin composites

Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1989-07-03 DOI:10.1109/ICSD.1989.69155

A. Kawamoto, Y. Suzuoki, T. Ikejiri, T. Mizutani, M. Ieda

{"title":"Photocurrents and thermally stimulated currents in epoxy resin composites","authors":"A. Kawamoto, Y. Suzuoki, T. Ikejiri, T. Mizutani, M. Ieda","doi":"10.1109/ICSD.1989.69155","DOIUrl":null,"url":null,"abstract":"The authors prepared epoxy-alumina two-layer composite films as models of a polymer-filler interface and studied the effect of interfaces on electronic conduction by measuring photocurrents and thermally stimulated currents (TSC). It is shown that, at high fields and low temperatures, holes are more mobile than electrons in epoxy-alumina composites, independent of mechanical stress. Most of the holes in the epoxy layer can pass through the epoxy-alumina interface and move in the alumina bulk, increasing the conduction current in the alumina by about two orders of magnitude. This interfacial phenomenon cannot be explained by the conventional Maxwell-Wagner model. TSC measurements on the composite showed that some of the holes were trapped at the epoxy-alumina interface, in the alumina bulk or the epoxy bulk near the interface, and gave rise to new TSC peaks. At high fields and room temperature, the photoconduction is governed by the alumina layer and is well explained by Maxwell-Wagner model. The dark current in the composite is governed by the epoxy layer.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1989.69155","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

Abstract

The authors prepared epoxy-alumina two-layer composite films as models of a polymer-filler interface and studied the effect of interfaces on electronic conduction by measuring photocurrents and thermally stimulated currents (TSC). It is shown that, at high fields and low temperatures, holes are more mobile than electrons in epoxy-alumina composites, independent of mechanical stress. Most of the holes in the epoxy layer can pass through the epoxy-alumina interface and move in the alumina bulk, increasing the conduction current in the alumina by about two orders of magnitude. This interfacial phenomenon cannot be explained by the conventional Maxwell-Wagner model. TSC measurements on the composite showed that some of the holes were trapped at the epoxy-alumina interface, in the alumina bulk or the epoxy bulk near the interface, and gave rise to new TSC peaks. At high fields and room temperature, the photoconduction is governed by the alumina layer and is well explained by Maxwell-Wagner model. The dark current in the composite is governed by the epoxy layer.<>

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环氧树脂复合材料中的光电流和热刺激电流

制备了环氧-氧化铝两层复合薄膜作为聚合物-填料界面模型，并通过测量光电流和热激发电流(TSC)研究了界面对电子传导的影响。结果表明，在高场和低温下，环氧-氧化铝复合材料中的空穴比电子更具流动性，而不受机械应力的影响。环氧层中的大多数孔可以穿过环氧-氧化铝界面并在氧化铝体中移动，使氧化铝中的传导电流增加了约两个数量级。这种界面现象不能用传统的麦克斯韦-瓦格纳模型来解释。复合材料的TSC测试表明，部分空穴被困在环氧-氧化铝界面、氧化铝本体或界面附近的环氧本体中，并产生新的TSC峰。在高场和室温下，光传导受氧化铝层控制，可以用麦克斯韦-瓦格纳模型很好地解释。复合材料中的暗电流由环氧树脂层控制。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics

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