{"title":"Overview of FPGA and CPLD Device Testing Techniques Based on ATE","authors":"Weikun Xie, Xiaohui Lin, Houjun Wang, Kaihong Zhang","doi":"10.1109/ICCS52645.2021.9697195","DOIUrl":null,"url":null,"abstract":"Aiming at the test and development of programmable logic devices, this article focuses on the differences in FPGA test configurations from vendors, the differences in CPLD test configurations from vendors, and the differences between FPGA and CPLD device testing. Based on these analysis conclusions, it will play a certain guiding role for subsequent test development and engineering applications.","PeriodicalId":163200,"journal":{"name":"2021 IEEE 3rd International Conference on Circuits and Systems (ICCS)","volume":"92 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 3rd International Conference on Circuits and Systems (ICCS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCS52645.2021.9697195","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Aiming at the test and development of programmable logic devices, this article focuses on the differences in FPGA test configurations from vendors, the differences in CPLD test configurations from vendors, and the differences between FPGA and CPLD device testing. Based on these analysis conclusions, it will play a certain guiding role for subsequent test development and engineering applications.