Overview of FPGA and CPLD Device Testing Techniques Based on ATE

Weikun Xie, Xiaohui Lin, Houjun Wang, Kaihong Zhang
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Abstract

Aiming at the test and development of programmable logic devices, this article focuses on the differences in FPGA test configurations from vendors, the differences in CPLD test configurations from vendors, and the differences between FPGA and CPLD device testing. Based on these analysis conclusions, it will play a certain guiding role for subsequent test development and engineering applications.
基于ATE的FPGA和CPLD器件测试技术综述
本文针对可编程逻辑器件的测试与开发,重点介绍了各厂商FPGA测试配置的差异,各厂商CPLD测试配置的差异,以及FPGA与CPLD器件测试的差异。基于这些分析结论,将对后续的试验开发和工程应用起到一定的指导作用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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