Test control algorithms for the validation of cyber-physical systems product lines

Abstract

Cyber-Physical Systems (CPSs) product lines appear in a wide range of applications of different domains (e.g., car's doors' windows, doors of a lift, etc.). The variability of these systems is large and as a result they can be configured into plenty of configurations. Testing each of the configurations can be time consuming as not only software has to be simulated, but also the hardware and the physical layer of the CPS, which is often modelled with complex mathematical models. Choosing the adequate test control strategy is critical when testing CPSs product lines. This paper presents a set of test control algorithms organized in an architecture of three layers (domain, application and simulation) for testing CPSs product lines. An illustrative example of a CPS product line is presented and three experiments are conducted to measure the performance of the proposed test control algorithms. We conclude that test scheduling and test suite minimization significantly help to reduce the overall test costs while preserving the test quality in CPSs product lines. In addition, we conclude that knowing the results of the previously tested configurations permits reducing the time for the detection of anomalous designs.