Advanced aging failure model for overhead conductors

Wilson A. Vasquez, D. Jayaweera, Jesus Jativa-Ibarra
{"title":"Advanced aging failure model for overhead conductors","authors":"Wilson A. Vasquez, D. Jayaweera, Jesus Jativa-Ibarra","doi":"10.1109/ISGTEurope.2017.8260134","DOIUrl":null,"url":null,"abstract":"Aging failure modeling is a fundamental requirement in reliability assessment of any actual power system. The level of model detail can potentially reflect realistic means of reliability indices. In that context, this paper proposes an advanced aging failure model for overhead conductors, incorporating the effects of loading and weather conditions into the unavailability calculation. The Arrhenius life-temperature relationship is used to model the lifetime of conductors as a function of temperature. The life measure of the Arrhenius model is adopted as the scale parameter of the Weibull probability distribution. The approach to estimate parameters of the resulting Arrhenius-Weibull distribution is described in detail. Unavailability calculations are performed using the proposed aging failure model for a distribution test system. The results show that if the maximum continuous operating temperature is exceeded, the unavailability of overhead conductors increases depending on both time period, where the conductor temperature is higher than the threshold, and conductor age.","PeriodicalId":345050,"journal":{"name":"2017 IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT-Europe)","volume":"344 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT-Europe)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISGTEurope.2017.8260134","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

Abstract

Aging failure modeling is a fundamental requirement in reliability assessment of any actual power system. The level of model detail can potentially reflect realistic means of reliability indices. In that context, this paper proposes an advanced aging failure model for overhead conductors, incorporating the effects of loading and weather conditions into the unavailability calculation. The Arrhenius life-temperature relationship is used to model the lifetime of conductors as a function of temperature. The life measure of the Arrhenius model is adopted as the scale parameter of the Weibull probability distribution. The approach to estimate parameters of the resulting Arrhenius-Weibull distribution is described in detail. Unavailability calculations are performed using the proposed aging failure model for a distribution test system. The results show that if the maximum continuous operating temperature is exceeded, the unavailability of overhead conductors increases depending on both time period, where the conductor temperature is higher than the threshold, and conductor age.
架空导线老化失效的先进模型
老化失效建模是任何实际电力系统可靠性评估的基本要求。模型细节水平可以潜在地反映可靠性指标的实际方法。在此背景下,本文提出了一种先进的架空导线老化失效模型,将载荷和天气条件的影响纳入不可用性计算。阿累尼乌斯寿命-温度关系用于模拟导体的寿命作为温度的函数。采用阿伦尼乌斯模型的寿命测度作为威布尔概率分布的尺度参数。详细描述了估计得到的Arrhenius-Weibull分布参数的方法。利用提出的老化失效模型对配电网进行了不可用性计算。结果表明,如果超过最大连续工作温度,架空导线的不可用性随导线温度高于阈值的时间段和导线年龄的增加而增加。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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