High-Frequency Properties of Y-Ba-Cu-O Josephson Junctions Fabricated with Helium Ion Beam Irradiation

Anthony T. Cortez, E. Cho, Hao Li, D. Cunnane, B. Karasik, S. Cybart
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Abstract

We have fabricated spiral THz antennas containing embedded high $\mathrm{T}_{\mathrm{C}}\mathrm{YBa}_{2}\mathrm{Cu}_{3}\mathrm{O}_{7}$ (YBCO) focused helium ion beam Josephson junctions (JJ) for characterization of their high frequency characteristics. The values of the resistance and critical current of the junctions are controlled through the irradiation dose and geometry of the junction. We observe several orders of Shapiro steps in the current voltage characteristics of the device when irradiated with 0.6 THz and a single step when irradiated at 2.52 THz.
氦离子束辐照制备Y-Ba-Cu-O Josephson结的高频特性
我们制作了嵌入高$\ mathm {T} {\ mathm {C}}\ mathm {YBa}} {2}\ mathm {Cu}} {3}\ mathm {O}} {7}$ (YBCO)聚焦氦离子束约瑟夫森结(JJ)的螺旋太赫兹天线,用于表征其高频特性。通过辐照剂量和结的几何形状来控制结的电阻值和临界电流。我们观察到器件在0.6太赫兹辐射下的电流电压特性有几个阶次的夏皮罗阶跃,而在2.52太赫兹辐射下的电流电压特性只有一个阶跃。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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