Comprehensive implementation of the magnetic contact reliability test method

Abstract

In this paper the technical implementation of the test methods for reed switches (relays with magnetic contacts) in various modes was considered. The advantage of using microcontrollers in the test device is shown. A switching and amplification unit was developed, implemented and tested that sets the necessary limit for the gain of an automated complex for studying the low-noise noise spectra of low-impedance objects. Investigations of low-frequency noise in low-impedance structures were carried out and it was found that the features of metal coating of contacts affect the functional characteristics of reed switches and low-frequency noise parameters in the range of 0.01-1 Hz.