V. Dolinenko, E. V. Shapovalov, Yu. V. Kuts, M. Redka, V. Uchanin, N. Kpi»
{"title":"Modeling The Transient Processes In Measurement Channel Of Eddy-current Flaw Detector","authors":"V. Dolinenko, E. V. Shapovalov, Yu. V. Kuts, M. Redka, V. Uchanin, N. Kpi»","doi":"10.15407/TDNK2018.04.03","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":126730,"journal":{"name":"Tehničeskaâ diagnostika i nerazrušaûŝij kontrolʹ","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Tehničeskaâ diagnostika i nerazrušaûŝij kontrolʹ","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.15407/TDNK2018.04.03","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}