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Mach zinder photonics crystal fiber interferometer techniques for thin film thickness measurement

PROCEEDING OF THE 1ST INTERNATIONAL CONFERENCE ON ADVANCED RESEARCH IN PURE AND APPLIED SCIENCE (ICARPAS2021): Third Annual Conference of Al-Muthanna University/College of Science Pub Date : 1900-01-01 DOI:10.1063/5.0095410
B. Mahdi, N. A. Aljbar, Jamal F. Hamoody, A. Mahmood, Dunya A. J-Albazaz
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Mach zinder光子晶体光纤干涉仪薄膜厚度测量技术
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PROCEEDING OF THE 1ST INTERNATIONAL CONFERENCE ON ADVANCED RESEARCH IN PURE AND APPLIED SCIENCE (ICARPAS2021): Third Annual Conference of Al-Muthanna University/College of Science
PROCEEDING OF THE 1ST INTERNATIONAL CONFERENCE ON ADVANCED RESEARCH IN PURE AND APPLIED SCIENCE (ICARPAS2021): Third Annual Conference of Al-Muthanna University/College of Science
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