A geometric scattering expansion of the current on conducting surfaces and transmission line structures

Abstract

The coupling of electromagnetic fields into complex electronic systems plays an important role in EMC. Especially multiconductor transmission lines (MTLs) transport voltage- and current-perturbations to the entrance of sensitive devices. We derive a perturbative construction scheme for the current on oneand two-dimensional conducting geometries. These conductors can either be in the presence of electromagnetic sources or also be part of the source itself. The current is expressed in terms of a scattering expansion which turns out to be an expansion in the curvature of the conducting geometries. This geometric formalism allows one to perturbatively determine characteristic parameters of arbitrary transmission line structures.