GRASP based metaheuristics for layout pattern classification

Abstract

Layout pattern classification has been recently utilized in IC design. It clusters hotspot patterns for design-space analysis or yield optimization. In pattern classification, an optimal clustering is essential, as well as its runtime and accuracy. Within the research-oriented infrastructure used in the ICCAD 2016 contest, we have developed a fast metaheuristic for the pattern classification that utilizes the Greedy Randomized Adaptive Search Procedure (GRASP). Our proposed metaheuristic outperforms the best-reported results on all of the ICCAD 2016 benchmarks. In addition, we achieve up to a 50% cluster count reduction, and improve a runtime significantly compared to a commercial EDA tool provided in the ICCAD 2016 contest [1].