{"title":"Artifacts Sources In Interferometry","authors":"D. Eastman, C. A. Martin","doi":"10.1364/oft.1980.ffb3","DOIUrl":null,"url":null,"abstract":"Spurious interference effects in interferograms are investigated. These artifacts are caused by ghost reflections, dirt, and diffraction effects. Diagnosis and cures are discussed.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Workshop on Optical Fabrication and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/oft.1980.ffb3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Spurious interference effects in interferograms are investigated. These artifacts are caused by ghost reflections, dirt, and diffraction effects. Diagnosis and cures are discussed.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
