Crystallographic and optoelectronic properties of the novel thin film absorber Cu2GeS3

E. Robert, J. de Wild, Diego Colombara, P. Dale
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引用次数: 4

Abstract

Thin films of Cu2GeS3 are grown by annealing copper layers in GeS and S gaseous atmosphere above 460°C. Below 500°C the cubic polymorph is formed, having inferior optoelectronic properties compared to the monoclinic phase, formed at higher temperature. The bandgap of the cubic phase lies below that of the monoclinic phase: they are determined from absorption measurements to be 1.23 and 1.55 eV respectively. Photoluminescence measurements are performed and only the monoclinic Cu2GeS3 shows a photoluminescence signal with a peak maximum at 1.57 eV. We attribute this difference between cubic and monoclinic to the higher quasi fermi level splitting of the monoclinic phase. Wavelength dependent photoelectrochemical measurements demonstrate the Cu2GeS3 to be p-type with an apparent quantum efficiency of less than 3 % above the band gap.
新型薄膜吸收体Cu2GeS3的晶体学和光电子特性
在460℃以上的GeS和S气体气氛中,对铜层进行退火,得到了Cu2GeS3薄膜。在500°C以下形成立方晶型,与在较高温度下形成的单斜晶相相比,具有较差的光电性能。立方相的带隙低于单斜相的带隙:从吸收测量中确定它们分别为1.23和1.55 eV。光致发光测量结果表明,只有单斜Cu2GeS3在1.57 eV处显示出最大峰值的光致发光信号。我们将这种三次和单斜相之间的差异归因于单斜相更高的准费米能级分裂。波长相关的光电化学测量表明,Cu2GeS3为p型,在带隙以上的表观量子效率小于3%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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