L. Kirkland, Dave Jensen, C. Carlson, R. G. Wright
{"title":"Techniques to Solve TPS Performance Weaknesses","authors":"L. Kirkland, Dave Jensen, C. Carlson, R. G. Wright","doi":"10.1109/AUTEST.2018.8532555","DOIUrl":null,"url":null,"abstract":"Critical weaknesses in Test Program Set (TPS) designs can be deceiving and remain unknown causing diagnostic and performance problems. These can include weak mainline test flow with intermittent pass/fails, poor diagnostics with unacceptable fault detection algorithms, and/or ReTest Okay (RTOK) and Cannot Duplicate (CND) problems. Often associated with No-Fault-Found (NFF) conditions, their causes can include test limit variations, poor test program development practices, incorrect diagnostic callouts or even Automatic Test Equipment (ATE) performance issues. Also, these performance weaknesses may be attributed to Interface Test Adapter (ITA) design, test equipment selection and settings, power supply problems, wiring discrepancies, crosstalk, timing issues, speed, noise, physical connections and the test program software itself, Full understanding of TPS performance problems is often elusive as a result of symptoms that can be extremely deceiving where alternative methods for their resolution should be considered. This paper describes some of these methods and their usefulness.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2018.8532555","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Critical weaknesses in Test Program Set (TPS) designs can be deceiving and remain unknown causing diagnostic and performance problems. These can include weak mainline test flow with intermittent pass/fails, poor diagnostics with unacceptable fault detection algorithms, and/or ReTest Okay (RTOK) and Cannot Duplicate (CND) problems. Often associated with No-Fault-Found (NFF) conditions, their causes can include test limit variations, poor test program development practices, incorrect diagnostic callouts or even Automatic Test Equipment (ATE) performance issues. Also, these performance weaknesses may be attributed to Interface Test Adapter (ITA) design, test equipment selection and settings, power supply problems, wiring discrepancies, crosstalk, timing issues, speed, noise, physical connections and the test program software itself, Full understanding of TPS performance problems is often elusive as a result of symptoms that can be extremely deceiving where alternative methods for their resolution should be considered. This paper describes some of these methods and their usefulness.
测试程序集(TPS)设计中的关键弱点可能具有欺骗性,并且仍然未知,从而导致诊断和性能问题。这些问题可能包括主线测试流程薄弱,出现间歇性通过/失败,诊断不佳,出现不可接受的故障检测算法,以及/或出现ReTest ok (RTOK)和Cannot Duplicate (CND)问题。通常与无故障发现(NFF)条件相关联,其原因可能包括测试极限变化、糟糕的测试程序开发实践、不正确的诊断标注,甚至是自动测试设备(ATE)性能问题。此外,这些性能缺陷可能归因于接口测试适配器(ITA)设计、测试设备的选择和设置、电源问题、接线差异、串扰、时序问题、速度、噪声、物理连接和测试程序软件本身。由于症状可能极具欺骗性,因此对TPS性能问题的全面理解往往难以捉摸,因此应该考虑解决这些问题的替代方法。本文介绍了其中的一些方法及其用途。