Paolo Lazzaroni, M. Hammer, M. Manghisoni, A. Miceli, L. Ratti, V. Re
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引用次数: 0
Abstract
This work reports the current state of the development of a pixelated readout for nanometer resolution X-ray ptychography applications. A very dense, low-noise and low-power pixel developed in a commercial 65nm CMOS technology is envisioned for such applications, targeting a pixel area of 150 μm × 150 μm, an overall noise of 200e- rms and a power consumption of 150μW per pixel. In the paper, an introduction to the application and an overview of the experimental setup are given, the designed frontend channel is reported and revised in its components and simulation results of the schematic-level design are shown and discussed.