A design technique overview on broadband RF ESD protection circuit designs

Li Wang, R. Ma, Albert Z. H. Wang, Xin Wang, B. Zhao, X. S. Wang, P. Yue, Zitao Shi, Yuhua Cheng
{"title":"A design technique overview on broadband RF ESD protection circuit designs","authors":"Li Wang, R. Ma, Albert Z. H. Wang, Xin Wang, B. Zhao, X. S. Wang, P. Yue, Zitao Shi, Yuhua Cheng","doi":"10.1109/MWSCAS.2012.6292089","DOIUrl":null,"url":null,"abstract":"This paper presents an overview of the co-design technique for broadband RF ESD protection circuit designs. The unique mixed-mode ESD simulation design methodology allows full-chip design optimization and prediction of broadband RF ICs with full low-parasitic ESD protection, which were validated experimentally using ultra wideband (UWB) RF ICs and RF switch circuits in CMOS technologies.","PeriodicalId":324891,"journal":{"name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.2012.6292089","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

This paper presents an overview of the co-design technique for broadband RF ESD protection circuit designs. The unique mixed-mode ESD simulation design methodology allows full-chip design optimization and prediction of broadband RF ICs with full low-parasitic ESD protection, which were validated experimentally using ultra wideband (UWB) RF ICs and RF switch circuits in CMOS technologies.
宽带射频ESD保护电路设计技术综述
本文综述了宽带射频ESD保护电路设计中的协同设计技术。独特的混合模式ESD仿真设计方法允许全芯片设计优化和预测具有全低寄生ESD保护的宽带RF ic,并在CMOS技术中使用超宽带(UWB) RF ic和RF开关电路进行了实验验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信