Impact of the input baseband impedance on the intermodulation distortion and linearizability of RF power transistors

H. Ladhani, Jeffrey K. Jones, J. Staudinger, J. Kenney
{"title":"Impact of the input baseband impedance on the intermodulation distortion and linearizability of RF power transistors","authors":"H. Ladhani, Jeffrey K. Jones, J. Staudinger, J. Kenney","doi":"10.1109/RWS45077.2020.9050132","DOIUrl":null,"url":null,"abstract":"Nonlinearities in Radio Frequency Power Transistors can be attributed to mechanisms such as non-linear transconductances and nonlinear capacitances at the device terminals. In this paper, we extend the work in by Ladhani et al to include the impact of the nonlinear gate-source capacitance in a MOSFET (Metal Oxide Semiconductor Field Effect Transistor) and discuss its contribution (along with the gate baseband impedance) to the amplifier’s intermodulation distortion and linearizability. Measured results show that for a 140W (P1dB (1dB Compression Point)) Class AB LDMOS (Laterally Diffused Metal Oxide Semiconductor Field Effect Transistor) PA, an optimized gate baseband impedance provides 6dB improvement in corrected ACPR (Adjacent Channel Power Ratio) and 7dB improvement in corrected Alt-1 (First Adjacent Channel Power Ratio) at 7dB backoff from peak power using a 4-Carrier WCDMA (Wideband Code Division Multiple Access) signal.","PeriodicalId":184822,"journal":{"name":"2020 IEEE Radio and Wireless Symposium (RWS)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Radio and Wireless Symposium (RWS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RWS45077.2020.9050132","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

Nonlinearities in Radio Frequency Power Transistors can be attributed to mechanisms such as non-linear transconductances and nonlinear capacitances at the device terminals. In this paper, we extend the work in by Ladhani et al to include the impact of the nonlinear gate-source capacitance in a MOSFET (Metal Oxide Semiconductor Field Effect Transistor) and discuss its contribution (along with the gate baseband impedance) to the amplifier’s intermodulation distortion and linearizability. Measured results show that for a 140W (P1dB (1dB Compression Point)) Class AB LDMOS (Laterally Diffused Metal Oxide Semiconductor Field Effect Transistor) PA, an optimized gate baseband impedance provides 6dB improvement in corrected ACPR (Adjacent Channel Power Ratio) and 7dB improvement in corrected Alt-1 (First Adjacent Channel Power Ratio) at 7dB backoff from peak power using a 4-Carrier WCDMA (Wideband Code Division Multiple Access) signal.
输入基带阻抗对射频功率晶体管互调失真和线性化的影响
射频功率晶体管的非线性可归因于器件末端的非线性跨导和非线性电容等机制。在本文中,我们扩展了Ladhani等人的工作,包括MOSFET(金属氧化物半导体场效应晶体管)中非线性栅源电容的影响,并讨论了其对放大器互调失真和线性化的贡献(以及门基带阻抗)。测量结果表明,对于140W (P1dB (1dB压缩点))AB类LDMOS(横向扩散金属氧化物半导体场效应晶体管)PA,优化的门基带阻抗在4载波WCDMA(宽带码分多址)信号的峰值功率下降7dB时,校正后的ACPR(相邻通道功率比)提高了6dB,校正后的Alt-1(第一相邻通道功率比)提高了7dB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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