Supply chain risk mitigation for IT electronics

F. McFadden, Richard D. Arnold
{"title":"Supply chain risk mitigation for IT electronics","authors":"F. McFadden, Richard D. Arnold","doi":"10.1109/THS.2010.5655094","DOIUrl":null,"url":null,"abstract":"Supply Chain Risk Management (SCRM) is one of the 12 Comprehensive National Cybersecurity Inititiatives (CNCI), but the range of supply chain problems has not been defined rigorously, and effective defenses have not yet been developed. Risks range from the increased unreliability of counterfeits to data exfiltration and adversary control enabled by hardware Trojan horses embedded in chips. Risks are different for military vs. non-military Government vs. civilian organizations. We cite cases that underscore the reality of supply chain risk, and analyze the structure of supply chains that affect different part of the market for IT electronics, in order to provide a better understanding of attack methods. We discuss techniques for defending against the range of threats, and propose a practical solution based on a suite of simple, inexpensive test procedures that could be used to build an \"80% solution\" for detection of counterfeits and embedded malicious implants before they are deployed. Tests we have prototyped include power signatures and of IR thermographic signatures of boot events. Deployment of such a test suite would change the SCRM game by making it significantly more difficult for supply chain exploits to succeed.","PeriodicalId":106557,"journal":{"name":"2010 IEEE International Conference on Technologies for Homeland Security (HST)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"31","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Conference on Technologies for Homeland Security (HST)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/THS.2010.5655094","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 31

Abstract

Supply Chain Risk Management (SCRM) is one of the 12 Comprehensive National Cybersecurity Inititiatives (CNCI), but the range of supply chain problems has not been defined rigorously, and effective defenses have not yet been developed. Risks range from the increased unreliability of counterfeits to data exfiltration and adversary control enabled by hardware Trojan horses embedded in chips. Risks are different for military vs. non-military Government vs. civilian organizations. We cite cases that underscore the reality of supply chain risk, and analyze the structure of supply chains that affect different part of the market for IT electronics, in order to provide a better understanding of attack methods. We discuss techniques for defending against the range of threats, and propose a practical solution based on a suite of simple, inexpensive test procedures that could be used to build an "80% solution" for detection of counterfeits and embedded malicious implants before they are deployed. Tests we have prototyped include power signatures and of IR thermographic signatures of boot events. Deployment of such a test suite would change the SCRM game by making it significantly more difficult for supply chain exploits to succeed.
IT电子产品的供应链风险缓解
供应链风险管理(SCRM)是12项综合国家网络安全计划(CNCI)之一,但供应链问题的范围尚未得到严格定义,有效的防御措施尚未开发。风险范围从伪造品的不可靠性增加到数据泄露和嵌入芯片的硬件特洛伊木马的对手控制。军事、非军事、政府和民间组织的风险是不同的。我们列举了强调供应链风险现实的案例,并分析了影响IT电子产品市场不同部分的供应链结构,以便更好地理解攻击方法。我们讨论了防御各种威胁的技术,并基于一套简单、廉价的测试程序提出了一个实用的解决方案,该解决方案可用于构建“80%解决方案”,用于在部署之前检测假冒产品和嵌入式恶意植入物。我们的原型测试包括功率签名和启动事件的红外热成像签名。这样一个测试套件的部署将会改变SCRM的游戏规则,使供应链攻击的成功变得更加困难。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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