{"title":"A New Thyristor-based Delay Element for PUF Design","authors":"Chuang Bai, Guozhou Liu, Wei Zhang","doi":"10.1109/ISNE.2019.8896511","DOIUrl":null,"url":null,"abstract":"A new thyristor-based delay element for physical unclonable function (PUF) design is proposed in this paper. Thyristor-based delay element as PUF cell shows strong sensitivity to process variation and is little sensitive to supply voltage and temperature variations, which could effectively improve the uniqueness and stability of PUF design. Simulated results show that thyristor-based delay element has 12.5964 largest standard deviation of delay time over process variation, and 0.4766/1.0631 lowest standard deviation of delay time with respect to temperature variation from -$50^{\\circ }\\mathrm {C}$ to $100^{\\circ }\\mathrm {C}$, and supply voltage variation from 1.5V to 2.1V, compared with other delay elements.","PeriodicalId":405565,"journal":{"name":"2019 8th International Symposium on Next Generation Electronics (ISNE)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 8th International Symposium on Next Generation Electronics (ISNE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISNE.2019.8896511","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A new thyristor-based delay element for physical unclonable function (PUF) design is proposed in this paper. Thyristor-based delay element as PUF cell shows strong sensitivity to process variation and is little sensitive to supply voltage and temperature variations, which could effectively improve the uniqueness and stability of PUF design. Simulated results show that thyristor-based delay element has 12.5964 largest standard deviation of delay time over process variation, and 0.4766/1.0631 lowest standard deviation of delay time with respect to temperature variation from -$50^{\circ }\mathrm {C}$ to $100^{\circ }\mathrm {C}$, and supply voltage variation from 1.5V to 2.1V, compared with other delay elements.