In0.53Ga0.47As Nanosheet MOSFETs with Self-Heating Effects

P. Srinivas, Arun Kumar, P. Tiwari
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引用次数: 0

Abstract

Using well-calibrated electro-thermal simulations, the impact of self-heating on distortion parameters such as second-order harmonic distortion (HD2) and third-order harmonic distortion (HD3) characteristics has been investigated in this work. The presence of the self-heating effect degrades the RF characteristics of InGaAs nanosheet FETs. The influence of TA on distortion parameters is also examined by altering the ambient temperature (TA) from 300K to 360K. Our simulation anticipates a shift in distortion performance of InGaAs nanosheet FETs by increasing HD2 and HD3 by 25% and 4%, respectively, for a temperature increase of 60K above room temperature. With the introduction of highly thermally conducting buried oxide materials, the change in distortion performance of the InGaAs nanosheet MOSFET has also been observed with the rise in the minima of HD2 and HD3.
具有自热效应的纳米片mosfet
利用校准良好的电热模拟,研究了自加热对二阶谐波失真(HD2)和三阶谐波失真(HD3)特性等畸变参数的影响。自热效应的存在降低了InGaAs纳米片fet的射频特性。通过改变环境温度(TA)从300K到360K,考察了TA对畸变参数的影响。我们的模拟预测了InGaAs纳米片fet的畸变性能的变化,当温度比室温高60K时,HD2和HD3分别增加25%和4%。随着高导热埋藏氧化物材料的引入,也观察到InGaAs纳米片MOSFET的畸变性能随着HD2和HD3的最小值的增加而变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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