Novel phase formation and magnetism at the Sb2Te3/Ni80Fe20 interface

International Workshop on Thin Films for Electronics, Electro-Optics, Energy and Sensors Pub Date : 2023-01-31 DOI:10.1117/12.2647775

A. Will-Cole, James Hart, A. Podpirka, M. Matzelle, Nirjhar Bhattacharjee, S. Patel, Isabel Martos-Repath, B. Lou, S. Tolbert, A. Bansil, J. Cha, D. Heiman, N. Sun

引用次数: 0

Abstract

Investigation into the interface formed between Sb2Te3/Ni80Fe20 heterostructures – this is studied using temperature dependent magnetometry, scanning transmission electron microscopy, ferromagnetic resonance, and theoretical support.

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Sb2Te3/Ni80Fe20界面的新相形成和磁性

研究Sb2Te3/Ni80Fe20异质结构之间形成的界面-使用温度相关磁强计，扫描透射电子显微镜，铁磁共振和理论支持进行了研究。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

International Workshop on Thin Films for Electronics, Electro-Optics, Energy and Sensors

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