Worst case reliability prediction based on a prior estimate of residual defects

P. Bishop, R. Bloomfield
{"title":"Worst case reliability prediction based on a prior estimate of residual defects","authors":"P. Bishop, R. Bloomfield","doi":"10.1109/ISSRE.2002.1173274","DOIUrl":null,"url":null,"abstract":"In this paper we extend an earlier worst case bound reliability theory to derive a worst case reliability function R(t), which gives the worst case probability of surviving a further time t given an estimate of residual defects in the software N and a prior test time T. The earlier theory and its extension are presented and the paper also considers the case where there is a low probability of any defect existing in the program. For the \"fractional defect\" case, there can be a high probability of surviving any subsequent time t. The implications of the theory are discussed and compared with alternative reliability models.","PeriodicalId":159160,"journal":{"name":"13th International Symposium on Software Reliability Engineering, 2002. Proceedings.","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"13th International Symposium on Software Reliability Engineering, 2002. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSRE.2002.1173274","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21

Abstract

In this paper we extend an earlier worst case bound reliability theory to derive a worst case reliability function R(t), which gives the worst case probability of surviving a further time t given an estimate of residual defects in the software N and a prior test time T. The earlier theory and its extension are presented and the paper also considers the case where there is a low probability of any defect existing in the program. For the "fractional defect" case, there can be a high probability of surviving any subsequent time t. The implications of the theory are discussed and compared with alternative reliability models.
基于残余缺陷的先验估计的最坏情况可靠性预测
本文扩展了早期的最坏情况边界可靠性理论,导出了一个最坏情况可靠性函数R(t),该函数给出了给定软件N中残余缺陷的估计和先前测试时间t的最坏情况下存活时间t的概率。本文给出了早期的理论及其推广,并考虑了程序中存在任何缺陷的低概率情况。对于“分数缺陷”的情况,在任何后续时间t中都有很高的幸存概率。讨论了该理论的含义,并与其他可靠性模型进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信