Wennan Wang, Hanxu Zhao, Yu Li, J. Su, Jiadong Lu, Baoping Wang
{"title":"Research on cross-project software defect prediction based on feature transfer method","authors":"Wennan Wang, Hanxu Zhao, Yu Li, J. Su, Jiadong Lu, Baoping Wang","doi":"10.1145/3573834.3574472","DOIUrl":null,"url":null,"abstract":"In this paper, the research and experimental analysis of cross-project application software defect prediction is carried out, and the TCA model is used to improve the application function of its prediction. The models pointed out in this paper usually include: normalization processing model and mathematical linear kernel mathematical statistics The difference between the functional SVM classifier and the extended migration component analysis TCA+ model is that the model pointed out in this paper not only satisfies the prediction of software defects within the project suitable for TCA, but also meets the prediction of software defects in the cross-project of TCA+, so the most appropriate normalization can be selected. Optimized processing options to improve cross-project software defect prediction capabilities.","PeriodicalId":345434,"journal":{"name":"Proceedings of the 4th International Conference on Advanced Information Science and System","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-11-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 4th International Conference on Advanced Information Science and System","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3573834.3574472","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, the research and experimental analysis of cross-project application software defect prediction is carried out, and the TCA model is used to improve the application function of its prediction. The models pointed out in this paper usually include: normalization processing model and mathematical linear kernel mathematical statistics The difference between the functional SVM classifier and the extended migration component analysis TCA+ model is that the model pointed out in this paper not only satisfies the prediction of software defects within the project suitable for TCA, but also meets the prediction of software defects in the cross-project of TCA+, so the most appropriate normalization can be selected. Optimized processing options to improve cross-project software defect prediction capabilities.