Simple susceptibility model of two wires to predict EM wave pickup in an EMI/EMC environment

A. Roy, S. Ghosh, A. Chakrabarty
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引用次数: 2

Abstract

EMI is everywhere, inside and outside of all electrical equipment. Man-made EM1 is on the increase daily, due to the increased use of electrical and electronic equipment. The successful detection and elimination of EMI require a systematic search for EM1 sources as well as knowledge of interference susceptibilities of the equipment. Familiarity with the environment in which the equipment will work as well as possible alternative environments are fundamental to effective EMI reduction to a required minimum level. In this paper we designed a simple two wire model to predict EMI when this model is illuminated by a distant source antenna. The proposed model is being fabricated at Indian Institute of Technology, India. Measured and simulated results are shown. Simulations were being carried out at Kalpana Chawla Space Technology Cell, IIT Kharagpur, India.
用于预测电磁干扰/电磁兼容环境中电磁波拾取的简单两线磁化率模型
电磁干扰无处不在,在所有电气设备的内部和外部。由于电气和电子设备的使用增加,人造EM1每天都在增加。成功地检测和消除电磁干扰需要系统地搜索电磁干扰源以及了解设备的干扰敏感性。熟悉设备工作的环境以及可能的替代环境是有效地将电磁干扰降低到所需的最低水平的基础。在本文中,我们设计了一个简单的两线模型来预测该模型被远源天线照射时的电磁干扰。所提出的模型正在印度的印度理工学院制造。给出了实测和仿真结果。模拟是在印度Kharagpur理工学院的Kalpana Chawla空间技术单元进行的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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