Particle tracking from in-line holograms by using single wavelet coefficient

S. Soontaranon, J. Widjaja
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Abstract

We propose a new digital method for tracking position of particles from in-line holograms by using single wavelet coefficient. By computing a wavelet transform of the 1-D intensity profile of a hologram, resultant wavelet coefficients provide space-varying frequency information of an interference pattern. Our study finds that a dilation which is given by the maximum value of the real wavelet coefficient appeared at the center position of the interference pattern is determined by a recording distance and a wavelength of a coherent illuminating light. Therefore, this dilation can be used for extracting the recording distance of particles from the holograms. A feasibility of this method is experimentally verified by analyzing holograms of a line object.
基于单小波系数的直线全息图粒子跟踪
本文提出了一种利用单小波系数跟踪直线全息图中粒子位置的新方法。通过计算全息图的一维强度剖面的小波变换,得到的小波系数提供了干涉图样的空间变化频率信息。我们的研究发现,干涉图样中心位置的实小波系数的最大值所给出的膨胀是由记录距离和相干照射光的波长决定的。因此,这种膨胀可以用于从全息图中提取粒子的记录距离。通过对直线物体全息图的分析,验证了该方法的可行性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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