Flash X-Ray Diffraction System for Ultrafast Temperature and Phase Transition Measurements

D. Morgan, D. Macy, M. Madlener, J. Morgan
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Abstract

A novel ultrafast diagnostic for determining bulk temperature and phase transitions for polycrystalline metal objects has been developed. The diagnostic consists of a 38-stage Marx bank with a cable-coupled X-ray diode that produces a 35-ns pulse of mostly 0.71 Angstrom monochromatic X rays, and a P-43 fluor coupled to a cooled charge-coupled device camera by a coherent fiber-optic bundle for detection of scattered X rays. The X-ray beam is collimated to a 1deg divergence in the scattering plane with the combination of a 1.5-mm tungsten pinhole and a 1.5-mm diameter molybdenum anode. The X-ray diode, in a needle-and-washer configuration, is heavily shielded in all directions other than the collimated beam. The X-ray diode has a sealed reentrant system, which allows the X rays to be produced inside a vacuum containment vessel, close to the sample under study. The direct correlation between the solid-state structure and the coherent X-ray diffraction pattern from a metal surface allows an unequivocal determination of a phase transition. This correlation has been tested in the laboratory with samples of indium and tin. For both metals, diffraction lines were observed at temperatures just below the melt temperature, along with background consisting of Compton scattering and sample fluorescence. Upon melt, the diffraction lines were observed to disappear; however, the background from Compton scattering and sample fluorescence remained. Flash X-ray diffraction also enables direct ultrafast measurements of the bulk temperature of the sample under study. According to the Debye-Waller theory, the diffracted line intensity reduces as the temperature of the sample increases. The amplitude of the reduced diffracted signal also depends on the Debye temperature of the sample, the scattering angle of the diffracted X rays, and the X-ray wavelength. The feasibility of using the Debye-Waller theory for flash X-ray diffraction measurements of the bulk temperature is currently being studied.
用于超快温度和相变测量的闪光x射线衍射系统
开发了一种新的超快速诊断方法,用于测定多晶金属物体的体温和相变。该诊断装置包括一个38级Marx bank,带有一个电缆耦合X射线二极管,产生35ns脉冲,主要为0.71埃的单色X射线,以及一个P-43荧光,通过相干光纤束耦合到一个冷却电荷耦合器件相机,用于检测散射X射线。在1.5 mm的钨针孔和1.5 mm直径的钼阳极的组合下,x射线束在散射平面上准直至1度发散。x射线二极管,在针-垫圈结构中,在除准直光束以外的所有方向上都被严格屏蔽。X射线二极管有一个密封的再入系统,它允许X射线在真空容器内产生,靠近所研究的样品。固体结构和金属表面的相干x射线衍射图之间的直接关联可以明确地确定相变。这种相关性已经在实验室中用铟和锡的样品进行了测试。对于这两种金属,在熔体温度以下的温度下观察到衍射线,以及由康普顿散射和样品荧光组成的背景。熔化后,衍射线消失;然而,康普顿散射和样品荧光的背景仍然存在。闪光x射线衍射也可以直接超快测量所研究样品的体温度。根据德拜-沃勒理论,衍射线强度随着样品温度的升高而降低。简化后的衍射信号的振幅还取决于样品的德拜温度、衍射X射线的散射角和X射线波长。目前正在研究用德拜-沃勒理论测量体温的可行性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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